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Microwave Design
-
Advanced Design System (2004A)
from Agilent technologies
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HFSS v.10.0 from Ansoft
Corporation
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SONNET Electromagnetic
Simulation Suite
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AWR Microwave Office 2004
-
MathCAD 12 Professional
from Mathsoft
RF Micro
fabrication Lab Facilities
-
Modular Clean Room with
chemical hoods
-
Quintel 4000 Series Mask
Aligner
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Parylene Deposition System
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Plasmod Tabletop Plasma Etcher
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Denton Thermal Evaporator
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PVDX Custom E-Beam Evaporator
-
Tousimis Critical Point Dryer
-
Tencor P-1 Long Scan Profiler
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Programmable Convection
Furnace and Bake Ovens
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Wire Bonder
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LPKF Automatic Milling Machine
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RF Sputter System (shared)
In addition the group has
access to the Class 1000 Clean Room, Metrology and Thin Film
Deposition tools at the
NanoMaterials
and NanoManufacturing Research Center at USF
Microwave Measurement
Resources
- Basic JMicro Tabletop Probe Stations
- Semi-Automatic Karl Suss Probe Station
equipped with an Anritsu Wiltron VNA System capable of measurements
up to 110 GHz
- Semi-Automatic Cascade Probe Station with a
Cryogenic temperature controlled (-55 C to +200 C) chuck capable of
measurements up to 50 GHz
- HP 8753 VNA (30 KHz to 6 GHz)
- HP 8719 VNA (40 MHz to 13.5 GHz)
- HP 4142 (Semiconductor Parameter Analysis)
System
- Agilent 4287A LCR Meter (1 MHz to 3 GHz)
- Accent DIVA (Dynamic I -V Measurement System)
- Anritsu Lightning VNA ( 40 MHz to 65 GHz)
- Maury Automated Amplifier Load Pull
Measurement System
- Anechoic Chamber with Motorized Automatic
Data Acquisition Controller for Antenna Measurements
- LabView based Custom System for RF MEMS
Switching Speed Measurement
- Screen Room for Noise Parameter
Characterization...
and a host of Spectrum Analyzers, Oscilloscopes, Power Supplies etc to
support a broad spectrum of measurement needs
RF Microsystems
Group
A part of the
Center for Wireless and Microwave and Information Systems, USF |
